By Bharat Bhushan, Harald Fuchs
This quantity will research the actual and technical origin for fresh growth in utilized scanning probe concepts. the 1st quantity got here out in January 2004 and the second one to fourth volumes in early 2006. the sector is progressing so quickly that there's a desire for virtually one quantity each 12 to 18 months to catch most modern advancements. those volumes represent a well timed complete assessment of SPM purposes. business purposes span topographic and dynamical floor reports of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. After introducing scanning probe microscopy, together with sensor expertise and tip characterization, chapters on use in a number of commercial purposes are provided. The chapters may be written by means of prime researchers and alertness scientists from world wide and from a variety of industries to supply a broader viewpoint.
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Extra info for Applied scanning probe methods 5 scanning probe microscopy techniques
Nelson, William P. King . . . . . . . . . . 251 Subject Index . . . . . . . . . . . . . . . . . . . . . . . . . . jp Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. edu Daniel Ebeling Center for NanoTechnology (CeNTech), Heisenbergstr. ch Hendrik Hölscher Center for NanoTechnology (CeNTech), Heisenbergstr. edu Tilman E. Schäffer Institute of Physics and Center for Nanotechnology, University of Münster Heisenbergstr.
De Robert A. de Ronnie T. 1 Overview Since Binnig, Quate and Gerber presented the ﬁrst atomic force microscope (AFM) in 1986 , it has developed at a remarkable pace from a laboratory instrument to a commercial tool that is currently used in many domains in research and in industry. In research, surface and interface properties down to the molecular level are of interest, whereas typical industrial applications are related to quality control. The optical readout of a passive cantilever by means of a laser beam is the most common detection principle.
For contact-mode measurements, a spring constant on the order of 1 N/m is desirable to keep the tip wear and the tip-induced alterations to the sample (indentation) low while still maintaining good contact with the sample. , van der Waals forces) and to have a high resonance frequency and, consequently, a high oscillation quality factor. The spring constant of a uniform silicon cantilever is given by k= Ebh 3 4L 3 where E is the apparent Young’s modulus, and b, h, and L denote the cantilever width, thickness, and length, respectively.